Presentation
Presentation: High-Resolution High-Sensitivity Mass Analyzers For ICPMS
Source: Pittcon 2012
Basic idea of SF-MS
- Focus an entrance slit as object of an ion optical lens to the collector (exit slit, detector).
- The fundamental equation for SF-MS shows that mass/charge is directly proportional to the square of the magnetic field and the square of the radius of curvature and to the inverse of the accelerating voltage.
- Images of ions with different masses are generated at spatially separated positions, which is the precondition for true multicollection.
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